GeminiDrake 

WinForms visualization controls for semiconductor test data. Includes trend charts, histograms (4 binning methods), box plots, cumulative probability plots (Normal/LogNormal/Weibull), wafer maps with... More information

Core library for semiconductor production test data analysis. Provides STDF V4 record-level parsing, multi-sublot and retest data correlation, parallel statistical analysis (Cp/Cpk, distributions), DeviceID... More information